Performance analysis of manufacturing
Bridging the gap between industry and academia?
June 19 & 20, 2006
EURANDOM, Eindhoven, The Netherlands
Programme & Abstracts| Speakers & Participants |Registration | Practical Information
Discrete manufacturing systems, throughput and flow time are key performance measures. Throughput refers to the number of finished parts per unit of time and flow time refers to the time a part needs to go through the complete sequence of process operations. For a successful improvement of throughput and flow time performance, insight in Factory Physics, i.e. the main factors that are responsible for capacity losses, is essential. Even small reductions of capacity loss may yield significant benefits, and therefore, industry puts great efforts in identifying and reducing the sources of capacity loss.
Nowadays, the overall equipment effectiveness (OEE) is widely used to quantify capacity losses in manufacturing equipment. The OEE directly relates to utilization, i.e., the fraction of time a workstation is busy. However, the performance of manufacturing systems is not only determined by utilization, but also by the variability in production processes. By only focussing on utilization one may overlook opportunities for performance improvement by reduction of variability.
A way to quantify both utilization and variability is by means of the Effective Process Time (EPT). This is the clean process time including other sources of additional waiting, such as, for example, setups, operator unavailability and machine failures. From an operational point of view it is very important to be able to measure EPTs without the need to identify all sources that cause capacity losses. Additionally, an aggregate modeling framework is required to beneficially use the measured EPT data for understanding the Factory Physics and to identify sources of capacity loss.
The goal of this workshop is to bring together industry and academia to discuss the performance analysis of discrete manufacturing systems, for which discrete-event simulation models and analytical queueing models provide a common tool. Theoretical developments in this area as well as applications to manufacturing will receive attention. Emphasis will be on aggregate models for manufacturing systems, as well as on incorporating manufacturing data into these models.
The flavour of the first day is application oriented; the emphasis of the second day is on theoretical developments. Both speakers from industry and academics will be invited.
Monday June 19, 2006
|09.45||Gershwin (MIT)||Manufacturing Systems Design and Analysis --- Past Successes and Future Research|
|11.15||Etman (TU/e)||STW-project Effective Process Time: an overview|
|11.45||Kock (TU/e)||Lumped parameter modelling of the litho cell|
|12.15||Van Vuuren (TU/e)||Performance Analysis of a Production Line with an Assembly Node|
|14.00||Resing/van Doremalen (CQM)||Performance analysis of manufacturing systems: a practitioner's point of view|
|14.30||Nijsse (VDL Steelweld)||EPT throughput control in the automotive industry|
|15.45||Van der Eerden (ASML)||Litho area cycle time improvements in an advanced 300mm semiconductor manufacturing line|
|16.15||Van Campen (Philips Semiconductors)||Cycle time in semiconductor manufacturing: challenges for the EPT|
|17.00||Lefeber (TU/e)||Modeling and Control of Manufacturing Systems|
|17.30||Drinks (at Eurandom)|
|19.00||Diner||Restaurant 'Listers' Centrum, Kleine Berg 57h, Eindhoven, tel. 040 - 2961370|
Tuesday June 20, 2006
|09.30||de Kok/ v. Houtum (TU/e)||Modelling manufacturing systems|
|11.00||Weiss (University of Haifa)|
|12.00||Rose (Dresden University of Technology)||Benefits and drawbacks of simple models for complex production systems|
|14.00||Scholz-Reiter (University of Bremen)|
|15.00||Armbruster (Arizona State University & TU/e)||Continuum models and their validation for semiconductor production|
|16.15||Adan (TU/e)||Mean value analysis for polling systems|
There is no registration fee.
PLEASE REGISTER BY FILLING IN THE FORM
I.J.B.F. Adan (I.J.B.F.Adan@tue.nl), O.J. Boxma (O.J.Boxma@tue.nl), L.F.P. Etman (L.F.P.Etman@tue.nl), A.A.J. Lefeber (A.A.J.Lefeber@tue.nl), J.E. Rooda (J.E.Rooda@tue.nl).
This workshop is sponsored by
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